Mechanical Engineering
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Dr. Jharna Chaudhuri, Dept. Chair

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Dr. Jharna Chaudhuri
Chair, Department of Mechanical Engineering
Texas Tech University
Lubbock, TX 79409-1021

Tel: (806)742-3563 ext. 224
Fax: (806)742-3540
email: jharna.chaudhuri@ttu.edu

Education

 

Curriculum Vita

 

 

Experience

Teaching Areas

Research Interests

Recent Publications

Journals

  1. “Transmission electron microscopy study of Eu-doped Y2O3 nanosheets and nanotubes,” H.T. Sun, J. Chaudhuri, E. A. Kenik, H. Zhu and Y. Ma, Nanoscience and Nanotechnology Letters (accepted, Feb., 2011).
  2. “Functionalization of graphene sheets through fullerene attachment,” Yue Zhang, Liqiang Ren, Shiren Wang, Archis Marathe, Jharna Chaudhuri, Guigen Li, Journal of Materials Chemistry (Accepted, Feb., 2011).
  3. “Transmission electron microscopy study of defects in AlN crystals with rough and smooth surface grains,” L. O. Nyakiti, J. Chaudhuri, Z. Gu  and J. H. Edgar, submitted to J. Cryst. Growth 312, 3479 – 3484, 2010.
  4. “Modeling of the effects different substrate materials on the residual thermal stresses for aluminum nitride crystal growth by sublimation,” R. G. Lee, A. Idesman, L.O. Nyakiti, and J. Chaudhuri, J. Appl. Phys. 105, 033521-033525, 2009.
  5. "Compression of a crystalline ZnO nanotube: An experimental exploration of the B4 to B1 transition mechanism",   D. Hou, Y. Ma, Ch. Gao, J. Chaudhuri, R. G. Lee, and H. Yang, J. Appl. Phys. 105, 104317 (2009).
  6. “Growth of GaN Nanowires on Epitaxial GaN” D. Aurongzeb, D. Y. Song, G. Kipshidze, B Yavich, L. Nyakiti, J. Chaudhuri, H. Temkin, and M. Holtz, J.  Electr. Mat. 37, 1076-1081, 2008.
  7. “Thermal oxidation of single crystalline aluminum nitride – a high resolution transmission electron microscopy study,” J. Chaudhuri, R. G. Lee, L. O. Nyakiti, Z. Gu, J. H. Edgar, P. Li, Mat. Lett. 62, 2465-2468, 2008.
  8. “Transmission electron microscopy study of defect-selective etched (010) ScN crystals,” J. Chaudhuri, R. G. Lee, L. Nyakiti, J. Armstrong, Z. Gu, J. H. Edgar, and J. G. Wen, Mat. Lett. 62, 27-29, 2008.
  9. “High-Resolution Electron Microscopy Characterization of Nanocrystalline Grain Boundaries in Gold-Copper Alloys,” L.O. Nyakiti, J. Chaudhuri, and A.F. Jankowski, Thin Solid Films 517, 1182-1185, 2008.
  10. “Native oxide and hydroxides and their implications for bulk AlN crystal growth,” J. H. Edgar, L. Du, L. O. Nyakiti, J. Chaudhuri, J. Cryst. Growth 310, 4002-4006 (2008).
  11. “Thermal oxidation of single crystalline aluminum nitride,” J. Chaudhuri, L. Nyakiti, R. G. Lee, Z. Gu, J. H. Edgar, J. G. Wen, Mat. Charact. 58, 672-679 (2007) (with figures in the cover page).
  12. “Molybdenum nitride nanoparticles – high-resolution transmission electron microscopy study,” J. Chaudhuri, L. Nyakiti, R. Lee, Y. Ma, P. Li, Q. L. Cui, L. H. Shen, Mat. Lett. 61, 4763-4765, 2007.
  13. “Modeling of residual stresses for aluminum nitride crystal growth on tungsten crucible by sublimation,” R. G. Lee, I. A., Idesman, L. Nayakiti and J. Chaudhuri, J. Appl. Phys. 102, 063525-1 – 063525-9 (2007).
  14. “Nucleation of AlN on SiC substrates by seeded sublimation growth,” P. Lu, J. H. Edgar, R. G. Lee, and J. Chaudhuri, J. Cryst. Growth. 300, 336-342 (2007).
  15. “Defect-selective etching of scandium nitride crystals,” Z. Gu, J. H. Edgar, D. W. Coffey, J. Chaudhuri, L. Nyakiti, R. G. Lee, J. G. Wen, J. Crystal Growth 293, 242-246 (2006).

 

Refereed Conference Proceedings

 

  1. “Transmission electron microscopy study of interface region of AlN/6H-SiC,” J. Chaudhuri,  L. O. Nyakiti, P. Lu, J. H. Edgar, and P. Li, Mat. Res. Soc. Symp. Proc. Vol. 1040, 1040-Q10-05 (2008).
  2. “Defect selective etching of thick AlN layers grown on 6H-SiC seeds – a transmission electron microscopy study,” L. Nyakiti, J. Chaudhuri, E. A. Kenik, P Lu, and J. H. Edgar,  Mat. Res. Soc. Symp. Proc. Vol. 1040, 1040-Q11-03 (2008).
  3. “High resolution transmission electron microscopy study of thermal oxidation of single crystalline aluminum nitride,” J. Chaudhuri, R. G. Lee, L. Nyakiti, Z. Gu, J. H. Edgar, and P. Li., MRS Symp. Proc. Vol. 955E, 0955-I09-01-03 (2007).
  4. “Oxidation of aluminum nitride for defect characterization,” J. H. Edgar, Z. Gu, K. Taggart, J. Chaudhuri, L. Nyakiti, R. G. Lee, and R. Witt, Mat. Res. Soc. Symp. Proc. Vol. 892, 0892-FF21-02.1-02.6 (2006).